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Applied and Environmental Microbiology, July 1999, p. 2841-2846, Vol. 65, No. 7
0099-2240/99/$04.00+0
Copyright © 1999, American Society for Microbiology. All rights reserved.

Stress Tolerance in Doughs of Saccharomyces cerevisiae Trehalase Mutants Derived from Commercial Baker's Yeast

Jun Shima,1,* Akihiro Hino,1 Chie Yamada-Iyo,1 Yasuo Suzuki,2 Ryouichi Nakajima,2 Hajime Watanabe,2 Katsumi Mori,1 and Hiroyuki Takano1

National Food Research Institute, 2-1-2 Kannondai, Tsukuba, Ibaraki 305-8642,1 and Tokyo Laboratory of Fermentation and Food Technology, Oriental Yeast Co. Ltd., 3-6-10 Azusawa, Itabashi, Tokyo,2 Japan

Received 9 November 1998/Accepted 9 April 1999

Accumulation of trehalose is widely believed to be a critical determinant in improving the stress tolerance of the yeast Saccharomyces cerevisiae, which is commonly used in commercial bread dough. To retain the accumulation of trehalose in yeast cells, we constructed, for the first time, diploid homozygous neutral trehalase mutants (Delta nth1), acid trehalase mutants (Delta ath1), and double mutants (Delta nth1 ath1) by using commercial baker's yeast strains as the parent strains and the gene disruption method. During fermentation in a liquid fermentation medium, degradation of intracellular trehalose was inhibited with all of the trehalase mutants. The gassing power of frozen doughs made with these mutants was greater than the gassing power of doughs made with the parent strains. The Delta nth1 and Delta ath1 strains also exhibited higher levels of tolerance of dry conditions than the parent strains exhibited; however, the Delta nth1 ath1 strain exhibited lower tolerance of dry conditions than the parent strain exhibited. The improved freeze tolerance exhibited by all of the trehalase mutants may make these strains useful in frozen dough.

* Corresponding author. Mailing address: National Food Research Institute, 2-1-2 Kannondai, Tsukuba, Ibaraki 305-8642, Japan. Phone: 81-298-38-8066. Fax: 81-298-38-7996. E-mail: shimaj{at}nfri.affrc.go.jp.

Applied and Environmental Microbiology, July 1999, p. 2841-2846, Vol. 65, No. 7
0099-2240/99/$04.00+0
Copyright © 1999, American Society for Microbiology. All rights reserved.


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