Previous Article | Next Article ![]()
Applied and Environmental Microbiology, September 2009, p. 5943-5951, Vol. 75, No. 18
0099-2240/09/$08.00+0 doi:10.1128/AEM.00975-09
Copyright © 2009, American Society for Microbiology. All Rights Reserved.
,
Noda Institute for Scientific Research, 399 Noda, Noda City 278-0037, Japan,1 Research Institute for Cell Engineering, National Institute of Advanced Industrial Science and Technology, Central 6, Higashi 1-1-1, Tsukuba, Ibaraki 305-8566, Japan2
Received 29 April 2009/ Accepted 15 July 2009
We previously developed two methods (loop-out and replacement-type recombination) for generating large-scale chromosomal deletions that can be applied to more effective chromosomal engineering in Aspergillus oryzae. In this study, the replacement-type method is used to systematically delete large chromosomal DNA segments to identify essential and nonessential regions in chromosome 7 (2.93 Mb), which is the smallest A. oryzae chromosome and contains a large number of nonsyntenic blocks. We constructed 12 mutants harboring deletions that spanned 16- to 150-kb segments of chromosome 7 and scored phenotypic changes in the resulting mutants. Among the deletion mutants, strains designated
5 and
7 displayed clear phenotypic changes involving growth and conidiation. In particular, the
5 mutant exhibited vigorous growth and conidiation, potentially beneficial characteristics for certain industrial applications. Further deletion analysis allowed identification of the AO090011000215 gene as the gene responsible for the
5 mutant phenotype. The AO090011000215 gene was predicted to encode a helix-loop-helix binding protein belonging to the bHLH family of transcription factors. These results illustrate the potential of the approach for identifying novel functional genes.
Published ahead of print on 24 July 2009.
Supplemental material for this article may be found at http://aem.asm.org/.
Copyright © 2009 by the American Society for Microbiology. For an alternate route to Journals.ASM.org, visit: http://intl-journals.asm.org | More Info»