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Applied and Environmental Microbiology, February 2005, p. 955-960, Vol. 71, No. 2
0099-2240/05/$08.00+0 doi:10.1128/AEM.71.2.955-960.2005
Copyright © 2005, American Society for Microbiology. All Rights Reserved.
Department of Chemical and Biochemical Engineering, University of Maryland, Baltimore County (UMBC), Baltimore,1 Department of Physics, Astronomy, and Geosciences, Towson University, Towson, Maryland2
Received 11 August 2004/ Accepted 27 September 2004
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Knowledge of spore cell wall mechanical properties is necessary for a complete understanding of molecular component ultrastructure. Spore mechanical properties are also relevant during wall expansion which occurs as part of the germination process. It has been pointed out that changes in cell wall mechanical properties are central to the emergence of the germ tube (6, 21). While a number of studies have described surface morphology (4, 13, 14, 31) and adhesive properties (7, 27) of fungal spores, no information is currently available on their relevant micromechanical properties (e.g., elasticity).
The elasticity of an object can be described in terms of stress and strain. Stress is defined as the force applied per unit area, while strain is the resulting amount of deformation per unit length. The ratio of stress to strain (for an elastic material following Hooke's law) is defined as the elastic modulus (E), and describes the mechanical resistance of a material during elongation or compression. A large E implies a stiff or strong material, while a small E implies a softer material. To measure E, as well as other micromechanical properties, of different types of biological materials, a number of authors have used atomic force microscopy (AFM) (1, 2, 32, 33). To carry out these types of tests, a rigid AFM probe is used as an "indenter" of the soft biological material, and the generated force-displacement data, or "force curves," are then used to calculate the elastic modulus of the sample (28).
Previous electron microscopy studies have shown "rodlet" structures on the Aspergillus nidulans spore wall (18). These are composed primarily of protein (4, 10, 31) and are thought to serve several different functions (31). Rodlet structures are related to the wall structural gene rodA (26), in that rodA spores lack the rodlet layer and are less hydrophobic than rodA+ spores (26). The goal in this work was to use AFM to study spores of A. nidulans by investigating surface morphology and calculating their elastic modulus. Three different A. nidulans strains (i.e., wild type, rodA+, and rodA) were studied and compared. Surface morphology of spores was imaged by tapping-mode AFM, and force displacement measurements were used to determine the elastic modulus.
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argB::trpC
B
rodA::argB veA1 trpC801), and rodA+ (A851; pabaA1 yA2
argB::trpC
B veA1 trpC801). Strains were stored as a frozen stock culture (5) and grown on potato dextrose agar (Difco, Detroit, Mich.) plates at 32°C for 3 to 4 days for sporulation. Round (12-mm diameter) glass coverslips (Fisher Scientific, Pittsburgh, Pa.) were cleaned with ethanol, coated with 0.01% poly-L-lysine (Sigma, St. Louis, Mo.) for 5 min, and used as the substrate for spore samples produced by the following two methods. "Untreated" spores were scratched from sporulated mycelial mats with an inoculating loop and, without further treatment, tapped over a poly-L-lysine-coated coverslip which was then used for AFM. Alternatively, "sonicated" spores were obtained from agar plates, suspended in sterile deionized water, and subjected to sonication (550 Sonic Dismembrator; Fisher Scientific, Pittsburgh, Pa.) at 4°C for 10 min with a 20% power output. After rinsing twice in deionized water, a drop of spore suspension was pipetted onto a poly-L-lysine-coated coverslip, allowed to dry in air (approximately 30 min), and subjected to AFM testing.
AFM imaging and force measurements.
All experiments were performed in air, using a multimode atomic force microscope (Nanoscope IIIa; Digital Instruments, Santa Barbara, Calif.) equipped with a J-type piezoscanner. Both rotated TappingMode Etched Silicon Probes (RTESP; Digital Instruments) and Olympus TappingMode Etched Silicon Probes (OTESP; Digital Instruments) were used for the imaging. Amplitude and height images were obtained in the tapping mode with a scan rate of 1 Hz and an integral gain of 0.3 to 0.5. The tapping force was adjusted by changing the set point voltage until high-resolution images were obtained in minimal tapping force. All images were recorded at room temperature and approximately 50% humidity. To perform force measurements, a spore was scanned in tapping mode to obtain a high-magnification image and to locate a position on the spore for force measurements. The cantilever tip was then withdrawn, and a force displacement curve was taken using the "trigger mode" (i.e., the piezo rises vertically until the preset maximal cantilever deflection, or maximal applied force, is reached and then retracts a distance equal to the preset vertical scan size). The cantilever deflection was calibrated by taking force curves on bare coverslips. To avoid large variation of spring constants of individual cantilevers, only one RTESP cantilever and one OTESP were used in all force measurements. The spring constants of these cantilevers were determined to be 61 and 82 N/m, respectively, by measuring the resonance frequencies of the cantilevers (11). The silicon tip was found to have a radius of 10 nm by scanning several calibration gratings and extracting the tip shape from the resulting image (data not shown). Force curve data were used to calculate stiffness and E as described in the next section. Statistical comparison was performed by using single-factor analysis of variance, and the results are presented with the P value.
Theory.
The presented micromechanical calculations assume that, in response to the external, concentrated, normal force exerted by the AFM tip, the A. nidulans spore wall is indented instead of bent or stretched. This assumption is based on the fact that A. nidulans spores possess cell walls several hundred nanometers in thickness (6), while the deformation depth involved in this study is only 5 to
10 nm.
Pharr et al. (23) showed that for any axis-symmetric indenters with smooth profiles, the unloading stiffness, dF/d
, is related to the projected contact area, A, and the reduced elastic modulus, Er, in the following equation:
![]() | (1) |
is the indentation depth.
In the contact region of the force curves, the displacement of the sample will produce a deflection of the cantilever. If both the cantilever and the sample are infinitely hard, then the cantilever deflection, d, will equal the sample displacement, z (assuming the initial contact point as the origin). Otherwise, the sample displacement equals the sum of the cantilever deflection and the indentation on the specimen:
![]() | (2) |
![]() | (3) |
![]() | (4) |
, Ei, and
o are the length, width, density, E, and resonance frequency of the cantilever, respectively.
At small indentation depths, as in this work, the apex of the AFM tip can be assumed to have a spherical profile with a radius of curvature, R. This assumption was tested by imaging the AFM probes used here over sharp calibration spikes. It was found that the contour of the lower portion of the tip could be approximated well by a hemisphere (data not shown). The projected area of elastic contact is then given by the geometry (Fig. 1A)
![]() | (5) |
p is the indentation depth below the circle of contact which is found from reference 15
![]() | (6) |
t, and residual depth,
r, are determined experimentally (Fig. 1B).
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FIG. 1. Schematic illustration of (A) elastic-plastic contact between a rigid spherical indenter and a specimen and (B) concurrent load versus displacement curve used to determine stiffness and the elastic modulus. R is the indenter radius, Ft is the maximum applied force, p is the indentation depth below the circle of contact, t is the maximum indentation depth, r is the residual depth, and dF/d is the unloading stiffness.
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is defined as the stiffness, S (Fig. 1B), and calculated from the observed slope, m, of the experimental force curves (d versus z) according to
![]() | (7) |
![]() | (8) |
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FIG. 2. Images generated by AFM in the tapping mode of the surface morphology of (A to C) untreated and (D to F) sonicated spores. (A and D) wild type; (B and E) rodA+; and (C and F) rodA. Bar length, 0.2 µm.
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Higher-resolution images revealed additional rodlet detail (Fig. 3). On both wild-type and rodA+ strains, the rodlet layer covered the entire surface of each domain, with each rodlet being approximately 10 nm in diameter and hundreds of nanometers in length. These observations are consistent with previous studies employing electron microscopy (14, 16) or contact mode AFM (13). Our images, however, reveal additional detail, as each rodlet appears to be composed of two strands, each of which is approximately 3 nm in diameter (Fig. 3D). Previous studies have shown rodlets are composed primarily of the protein hydrophobin (20, 30, 31), whose diameter is speculated to be approximately 3.1 nm (12), in close agreement with the strand diameters found here.
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FIG. 3. Images (A; height) and (B; amplitude) show the rodlet structure on the wild-type spores. (C) Cross-section along the line in panel A reveals the periodicity of the rodlets. Image D shows rodlets are apparently composed of two strands. Bar lengths: 50 nm in panels A and B and 10 nm in panel D.
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To assess reproducibility, force curves were repeatedly taken at the same position on a number of wild-type spores (Fig. 4). For the first several cycles, the approaching curves are not reproducible, implying plastic deformation or viscoelasticity that is not reversible on the time scale of the measurement. After enough cycles, force curves are reproducible, but instead of overlapping, the loading and unloading force curves exhibit hysteresis, implying viscous contributions from the spore. Because the initial portion of the unloading curves represents an elastic contact, data from unloading curves were used for calculation of Ê.
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FIG. 4. Typical force curves for five sequential tests at the same position on the same untreated wild-type spore, measured with an RTESP (k = 61 N/m). Loading curves (thick lines) are labeled 1 through 5. Unloading curves (thin lines) overlap.
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FIG. 5. Effect of increasing maximum applied force on (A) indentation depth and (B) apparent elastic modulus, Ê, for a wild-type spore, measured with an RTESP (k = 61 N/m). Error bars represent the standard error of the measurements shown in Fig. 7.
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FIG. 6. Force-displacement curves measured on the surface of (A) bare glass, (B) rodA, (C) rodA+, and (D) "sonicated" rodA+ with an OTESP silicon probe, k = 82 N/m. Dashed lines in the contact region represent initial slopes (m) of the unloading curves, which were determined to be 0.79, 0.60, and 0.84, respectively, for rodA, rodA+, and "sonicated" rodA+ spores.
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FIG. 7. Average values of (A) the apparent elastic modulus, Ê, and (B) the stiffness, S, for the wild-type, rodA+, and rodA A. nidulans spores, measured with an RTESP (k = 61 N/m on the wild type) and an OTESP (k = 82 N/m on rodA+ and rodA spores). Error bars represent the standard error of the measurements.
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-1,3 glucan, ß-1,3 glucan, and glycoproteins make up the wall matrix, while cross-linked polysaccharides such as chitin are primarily maintained in the inner wall layers (19). Our data imply that the rodlet-covered surface is softer than the rodlet-free surface. Thus, the rodlet protein surface layer is apparently softer than the complex matrix of cross-linked polysaccharides in the underlying wall structure. This matrix imparts great strength and has been compared to a man-made composite material (24). The relatively high wall elastic modulus we determined implies it is difficult for dormant spores to germinate, in which the yielding of the cell wall to the increasing turgor inside the cell leads to cell germination and the protrusion of germ tubes. Therefore, a decrease in wall strength or wall softening is assumed to accompany spore germination (21).
Conclusion.
While a number of studies are available on spore surface morphology, little is know about spore micromechanical properties. In this study, AFM was used to visualize the surface of fungal spores and to make measurements of the spore wall stiffness and elastic modulus. In agreement with others, we find the spore surface to be covered with a rodlet layer, apparently composed of protein. This layer was easily removed by sonication. Tests of spores with and without this rodlet layer show the stiffness and elastic modulus of rodA+ spores are approximately one-third the values of rodA spores. This implies that the rodlet layer is significantly softer than the underlying portion of the cell wall.
We thank M. P. Nandakumar for his assistance in fungal culture.
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