AEM -- Index by Author (Apr 1985; Volume 49, Number 4)

Index by Author: Apr 1985; 49 (4) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z | <

A: Ackland, N R [Abstract] [PDF]; Alexander, M [Abstract] [PDF]; Alexander, M [Abstract] [PDF]; Alpert, K B [Abstract] [PDF]
B: Bakker, D [Abstract] [PDF]; Bakker, D [Abstract] [PDF]; Bauer, J [Abstract] [PDF]; Bauer, J E [Abstract] [PDF]; Bessette, Alan E. [Abstract] [PDF]; Bhalla, T C [Abstract] [PDF]; Bollwahn, W [Abstract] [PDF]; Boyer, J C [Abstract] [PDF]; Brill, W J [Abstract] [PDF]; Bromel, M C [Abstract] [PDF]; Bruce, D L [Abstract] [PDF]
C: Capone, D G [Abstract] [PDF]; Ceglowski, P [Abstract] [PDF]; Cen, Ying H. [Abstract] [PDF]; Chai, M D [Abstract] [PDF]; Chaslus-Dancla, E [Abstract] [PDF]; Chelkowski, J [Abstract] [PDF]; Conway, L K [Abstract] [PDF]; Cooper, David G. [Abstract] [PDF]; Costello, P J [Abstract] [PDF]; Crawford, Don L. [Abstract] [PDF]; Cromeans, T [Abstract] [PDF]; Cullimore, D R [Abstract] [PDF]
D: Deeley, G M [Abstract] [PDF]; Dham, C K [Abstract] [PDF]; Dobrazanski, W T [Abstract] [PDF]; Duff, Sheldon J. B. [Abstract] [PDF]
E: Edenharder, R [Abstract] [PDF]; Evans, C [Abstract] [PDF]
F: Finnerty, W R [Abstract] [PDF]; Finnerty, W R [Abstract] [PDF]; Fuhrmann, J. [Abstract] [PDF]; Fuller, O. Maynard [Abstract] [PDF]
G: Gareis, M [Abstract] [PDF]; Gay, R [Abstract] [PDF]; Gealt, M A [Abstract] [PDF]; Gedek, B [Abstract] [PDF]; Geesey, G G [Abstract] [PDF]; Gerba, C P [Abstract] [PDF]; Ghosh, J [Abstract] [PDF]; Golinski, P [Abstract] [PDF]; Grabarkiewicz-Szczesna, J [Abstract] [PDF]
H: Haffie, Thomas L. [Abstract] [PDF]; Häggblom, P E [Abstract] [PDF]; Halvorson, D A [Abstract] [PDF]; Halvorson, M R [Abstract] [PDF]; Hand, R E, Jr [Abstract] [PDF]; Handelsman, J [Abstract] [PDF]; Hansen, Jeffrey B. [Abstract] [PDF]; Hartman, P A [Abstract] [PDF]; Hattori, T [Abstract] [PDF]; Hausfater, G [Abstract] [PDF]; Heinritzi, K [Abstract] [PDF]; Hicks, Brendan J. [Abstract] [PDF]; Higgins, Patrick [Abstract] [PDF]; Hijnen, W A [Abstract] [PDF]; Hult, K [Abstract] [PDF]
I: Ishikuri, S [Abstract] [PDF]
J: Jernigan, R [Abstract] [PDF]; Johnson, P W [Abstract] [PDF]; Jones, J G [Abstract] [PDF]
K: Kelleher, C J [Abstract] [PDF]; Kelley, L M [Abstract] [PDF]; Keyser, Harold H. [Abstract] [PDF]; Khachatourians, George G. [Abstract] [PDF]; Kisumi, M [Abstract] [PDF]; Knudson, G B [Abstract] [PDF]
L: Lafont, J P [Abstract] [PDF]; Levin, R E [Abstract] [PDF]; Levy, S B [Abstract] [PDF]; Lin, J H [Abstract] [PDF]; Louie, Paul W. [Abstract] [PDF]
M: Makarios-Laham, I [Abstract] [PDF]; Mann, R C [Abstract] [PDF]; Marshall, B [Abstract] [PDF]; Matsuda, M [Abstract] [PDF]; McCoy, W F [Abstract] [PDF]; McKay, L L [Abstract] [PDF]; Meade, James [Abstract] [PDF]; Melnick, J L [Abstract] [PDF]; Metcalf, T G [Abstract] [PDF]; Mittelman, M W [Abstract] [PDF]; Monk, P R [Abstract] [PDF]; Monticello, D J [Abstract] [PDF]; Monticello, D J [Abstract] [PDF]; Montville, T J [Abstract] [PDF]; Morris, H A [Abstract] [PDF]
N: Nakamura, Lawrence K. [Abstract] [PDF]; Novick, N J [Abstract] [PDF]
O: O'Gara, Fergal [Abstract] [PDF]; Okada, H [Abstract] [PDF]; Olson, B H [Abstract] [PDF]; Ounine, K [Abstract] [PDF]; Ozutsumi, K [Abstract] [PDF]
P: Parris, N [Abstract] [PDF]; Payment, P [Abstract] [PDF]; Petitdemange, H [Abstract] [PDF]; Petzel, J P [Abstract] [PDF]; Phillips, T D [Abstract] [PDF]; Plazinski, Jacek [Abstract] [PDF]; Plazinski, Jacek [Abstract] [PDF]; Plazinski, Jacek [Abstract] [PDF]; Plews, P I [Abstract] [PDF]; Pometto, Anthony L., III [Abstract] [PDF]; Pond, W G [Abstract] [PDF]
R: Raval, G [Abstract] [PDF]; Richards, G P [Abstract] [PDF]; Robertson, J M [Abstract] [PDF]; Robertson, L W [Abstract] [PDF]; Rolfe, Barry G. [Abstract] [PDF]; Rolfe, Barry G. [Abstract] [PDF]; Rolfe, Barry G. [Abstract] [PDF]; Rolland, R M [Abstract] [PDF]
S: Safe, S H [Abstract] [PDF]; Saini, S S [Abstract] [PDF]; Savage, D C [Abstract] [PDF]; Schell, M [Abstract] [PDF]; Schipper, I A [Abstract] [PDF]; Schmidt, S K [Abstract] [PDF]; Schneider, J [Abstract] [PDF]; Senne, D A [Abstract] [PDF]; Seo, C W [Abstract] [PDF]; Sieburth, J M [Abstract] [PDF]; Sieracki, M E [Abstract] [PDF]; Silvester, Warwick B. [Abstract] [PDF]; Simmonds, R S [Abstract] [PDF]; Simon, B M [Abstract] [PDF]; Skierkowski, P [Abstract] [PDF]; Sobsey, M D [Abstract] [PDF]; Sugimoto, N [Abstract] [PDF]; Sugiura, M [Abstract] [PDF]; Szebiotko, K [Abstract] [PDF]; Szücs, G [Abstract] [PDF]
T: Tannock, G A [Abstract] [PDF]; Thomas, T D [Abstract] [PDF]; Tiwari, R P [Abstract] [PDF]; Tremblay, M [Abstract] [PDF]; Trudel, M [Abstract] [PDF]; Tyndall, R L [Abstract] [PDF]
U: Unz, R F [Abstract] [PDF]
V: Vadehra, D V [Abstract] [PDF]; van der Kooij, D [Abstract] [PDF]; Vandenbergh, Peter A. [Abstract] [PDF]; Varel, V H [Abstract] [PDF]; Vidaver, Anne K. [Abstract] [PDF]
W: Weinheimer, D A [Abstract] [PDF]; Williams, T M [Abstract] [PDF]; Wollum, A. G., II [Abstract] [PDF]; Wong, S H [Abstract] [PDF]; Wright, Ann M. [Abstract] [PDF]
Y: Yamada, Y [Abstract] [PDF]; Yates, M V [Abstract] [PDF]; Young, I F [Abstract] [PDF]
Z: Zajdel, J K [Abstract] [PDF]
<: VAN Berkum, Peter [Abstract] [PDF]