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Statistical Analysis of Long- and Short-Range Forces Involved in Bacterial Adhesion to Substratum Surfaces as Measured Using Atomic Force Microscopy

Yun Chen, Henk J. Busscher, Henny C. van der Mei, Willem Norde
Yun Chen
W. J. Kolff Institute, Department of Biomedical Engineering, University Medical Center Groningen and University of Groningen, Antonius Deusinglaan 1, 9713 AV Groningen, The Netherlands
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Henk J. Busscher
W. J. Kolff Institute, Department of Biomedical Engineering, University Medical Center Groningen and University of Groningen, Antonius Deusinglaan 1, 9713 AV Groningen, The Netherlands
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Henny C. van der Mei
W. J. Kolff Institute, Department of Biomedical Engineering, University Medical Center Groningen and University of Groningen, Antonius Deusinglaan 1, 9713 AV Groningen, The Netherlands
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  • For correspondence: h.c.van.der.mei@med.umcg.nl
Willem Norde
W. J. Kolff Institute, Department of Biomedical Engineering, University Medical Center Groningen and University of Groningen, Antonius Deusinglaan 1, 9713 AV Groningen, The Netherlands
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DOI: 10.1128/AEM.00502-11
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Article Information

DOI 
https://doi.org/10.1128/AEM.00502-11
PubMed 
21642399

Published By 
American Society for Microbiology Journals
History 
  • Published online July 28, 2011.

Copyright & Usage 
Copyright © 2011, American Society for Microbiology. All Rights Reserved.

Article Versions

  • Accepted Manuscript version (June 03, 2011).
  • You are viewing the most recent version of this article.

Author Information

  1. Yun Chen,
  2. Henk J. Busscher,
  3. Henny C. van der Mei* and
  4. Willem Norde
  1. W. J. Kolff Institute, Department of Biomedical Engineering, University Medical Center Groningen and University of Groningen, Antonius Deusinglaan 1, 9713 AV Groningen, The Netherlands
  • ↵* Corresponding author. Mailing address: W. J. Kolff Institute, Department of Biomedical Engineering, University Medical Center Groningen and University of Groningen, Antonius Deusinglaan 1, 9713 AV Groningen, The Netherlands. Phone: 31-50-3633140. Fax: 31-50-3633159. E-mail: h.c.van.der.mei{at}med.umcg.nl.

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Statistical Analysis of Long- and Short-Range Forces Involved in Bacterial Adhesion to Substratum Surfaces as Measured Using Atomic Force Microscopy
Yun Chen, Henk J. Busscher, Henny C. van der Mei, Willem Norde
Applied and Environmental Microbiology Jul 2011, 77 (15) 5065-5070; DOI: 10.1128/AEM.00502-11

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Statistical Analysis of Long- and Short-Range Forces Involved in Bacterial Adhesion to Substratum Surfaces as Measured Using Atomic Force Microscopy
Yun Chen, Henk J. Busscher, Henny C. van der Mei, Willem Norde
Applied and Environmental Microbiology Jul 2011, 77 (15) 5065-5070; DOI: 10.1128/AEM.00502-11
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  • Top
  • Article
    • ABSTRACT
    • INTRODUCTION
    • THEORETICAL BACKGROUND OF POISSON ANALYSIS OF ADHESION FORCES
    • POISSON ANALYSIS OF BACTERIAL ADHESION FORCES
    • POISSON ANALYSIS OF THE WORK OF BACTERIAL ADHESION
    • CONCLUSIONS
    • REFERENCES
  • Figures & Data
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  • PDF

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